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K & Us Equipment, Inc., 13350 West
Park Ave., Ste B, Boulder Creek, CA 95006-9333, USA | Phone (831)
338-7246, Fax (831) 338-7962 | Contact www.kandus.com
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FEI Model FIB-205 Focused Ion Beam System
Description:
FEI Model FIB-205 Focused Ion Beam System
Model FIB 205, Vintage: 2000
Available for Inspection
A focused ion beam system (FIB) is a relatively new
tool that has a high degree of analogy with a focused electron beam system such
as a scanning electron microscope or a transmission electron microscope. In
these systems the electron beam is directed towards the sample, and upon
interaction it generates signals that are used to create high magnification
images of the sample. As the beam is well controlled in size and position and
the signals are strong enough to be detected without excessive noise, these
kinds of tools are very powerful to analyze samples in great detail over a wide
range of magnifications. As the name FIB indicates, ions are used instead of
electrons.
Price: CALL
Ref# 35393kk
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K & Us Equipment, Inc., 13350 West Park Ave., Ste B,
Boulder Creek, CA 95006-9333, USA | Phone (831) 338-7246, Fax (831)
338-7962 | Contact www.kandus.com
Copyright © 2010 K & Us
Equipment, Inc. All Rights Reserved |
